By Joe Kelly

That includes priceless enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its style source deals skilled engineers a finished realizing of the complicated themes in RF, SiP (system-in-package), and SoC (system-on-a-chip) creation checking out which are severe to their paintings regarding semiconductor units. The booklet covers key dimension recommendations for semiconductor equipment checking out and assists engineers in explaining those techniques to administration to help cut back undertaking price, time, and assets. in accordance with real-world adventure and jam-packed with time-saving equations, this in-depth quantity bargains pros functional details on crucial themes that experience by no means been awarded in one reference sooner than.

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Thus the noise figure (NF) of the LNA is often tested in production. From a design point of view, the difficult task is to provide high gain while minimizing the introduction of noise. These two items are mutually exclusive. The most common tests performed on an LNA are gain, VSWR, thirdorder intercept point (IP3), and NF (see Chapters 2 through 4). Gain is important because it determines the amount of amplification the LNA will perform on the incoming, often low-level, signal. VSWR gives an indication of the amount of reflection that occurs at the input of the LNA.

10] Agilent Technologies, “Wireless Test Solutions,” Application Note 1313, 2002. 15 Task Group 3A,” 2004. [12] OFDM Alliance, “Ultrawideband: High Speed, Short Range Technology with FarReaching Effects,” 2004. , “A Brief Overview of GSM,” University of Waterloo, 1995. asp, 1996. 1 S-Parameters One of the most frequently used methods to describe the functionality of RF devices is to use scattering parameters, or in short S-parameters. S-parameters are used to describe how a device alters voltage waves that are applied to its ports.

That means that the PLL in the Bluetooth radio has to be able to cover a frequency range of at least 80 MHz under the worst operating conditions such as the supply voltage being at the lower limit. PLL gain measurements can be performed by programming the dividers such that the PLL tunes to the lower frequency limit. Because the voltage that controls the VCO is dc in the case for which the VCO has settled, a simple voltage measurement is performed at the input of the VCO. Next, the dividers are programmed such that the PLL tunes to the upper frequency where the voltage at the input of the VCO is measured again.

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Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly

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